TLP116 2007-10-01 1 toshiba photocoupler gaa ? a s led & photo-ic TLP116 pdp(plasma display panel) high speed interface fa(factory automation) the toshiba TLP116 consists of a gaa ? as light-emitting diode and an integrated high-gain, hi gh-speed photodetector. z inverter logic (t otempole output) z package type : mfsop6 z guaranteed performance over temperature : -40~100c z power supply voltage : 4.5~5.5v z input thresholds current : i fhl =5ma(max.) z propagation delay time (tphl/tplh) : 60ns(max.) z switching speed : 20mbd(typ.) z common mode transient immunity : 10kv/us z isolation voltage : 3750vrms z ul recognized : ul1577,file no.e67349 truth table pin configuration (top view) input led tr1 tr2 output h on off on l l off on off h schematic toshiba 11-4c2 weight: 0.09 g(typ.) unit in mm 1:anode 3:cathode 4:gnd 5:vo 6:vcc 0.1uf bypass capacitor must be connected between pins 6 and 4 v cc v o gnd i cc i o 6 5 4 shield 3 1 i f tr1 tr2 vf 1 3 5 6 vcc gnd shield 4 free datasheet http:///
TLP116 2007-10-01 2 absolute maximum ratings (ta=25c) characteristic symbol rating unit forward current i f 20 ma forward current derating (ta 85 c) if/ ta - 0 . 5 m a / c peak transient forward current (note1) i fpt 1 a led reverse voltage v r 5 v output current i o 10 ma output voltage v o 6 v supply voltage v cc 6 v detector output power dissipation p o 40 mw operating temperature range topr -40~100 c storage temperature range tstg -55~125 c lead solder temperature(10s) tsol 260 c isolation voltage (ac,1min.,r.h. 60%,ta=25 c ) (note2) bvs 3750 vrms note: using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operat ing temperature/current/voltage, etc. ) are within the absolute maximum ratings and the operating ranges. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/?derating concept and methods?) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). recommended operating conditions characteristic symbol min typ. max unit input current , on i f(on) 8 ? 18 ma input voltage , off v f(off) 0 ? 0.8 v supply voltage (note3) v cc 4.5 5.0 5.5 v operating temperature topr -40 ? 100 c note: recommended operating conditions are given as a design guideline to obtain expected performance of the device. additionally, each item is an independent guide line respectively. in developing designs using this product, please confirm specified characteristics shown in this document. correlation between input current , switching speed and drive circuit (reference information). input current (if) test circuit typical switching speed 12ma 1 (page 4) 21 ? 23 mbd 8ma 1 (page 4) 18 ? 20 mbd 8ma 2 (page 4,with speed up capacitor) 23 ? 27 mbd note1 : pulse width pw 1us,300pps. note2 : this device is regarded as a two terminal device : pins 1 and 3 are shorted toget her, as are pins 4,5 and 6. note3 : the detector of this product requires a power supply volt age (vcc) of 4.5 v or higher for stable operation. if the vcc is lower than this value, an i cc may increase, or an output may be unstable. be sure to use the product after checking the supply current, and the oper ation of a power-on/-off. free datasheet http:///
TLP116 2007-10-01 3 electrical characteristics (unless otherwise specified, ta=-40 to 100 c,vcc=4.5~5.5v ) characteristic symbol te s t circuit conditions min. typ. max. unit input forward voltage v f ? i f =10ma ,ta=25 c ? 1.3 1.5 v temperature coefficient of forward voltage v f / ta ? i f =10ma ? -2.0 ? mv/ c input reverse current i r ? v r =5v,ta=25 c ? ? 10 a input capacitance c t ? v=0,f=1mhz,ta=25 c ? 70 ? pf logic low output voltage v ol 1 i ol =1.6ma, i f =12ma,v cc =5v ? ? 0.4 v logic high output voltage v oh 2 i oh =-0.02ma, v f =1.05v,v cc =5v 4.0 ? ? v logic low supply current i ccl 3 i f =12ma ? ? 5.0 ma logic high supply current i cch 4 v f =0v ? ? 5.0 ma input current logic low output i fhl ? i o =1.6ma,v o <0.4v ? ? 5 ma input voltage logic high output v flh ? i o =-0.02ma,v o >4.0v 0.8 ? ? v * all typical values are at ta=25 c,v cc =5v,i f (on)=12ma unless otherwise specified isolation characteristics (ta = 25c) characteristic symbol test conditions min. typ. max. unit capacitance input to output c s v = 0,f = 1mhz (note 2) D 0.8 D pf isolation resistance r s r.h. 60%,v s = 500v (note 2) 110 12 10 14 D ? ac,1 minute 3750 D D v rms ac,1 second,in oil D 10000 D isolation voltage bv s dc,1 minute,in oil D 10000 D vdc note 4:a ceramic capacitor(0.1 f) should be connected from pin 6 to pi n 4 to stabilize the operation of the high gain linear amplifier. failure to provide the bypass may impair the switching property. the total lead length between capacitor and coupler should not exceed 1 cm. free datasheet http:///
TLP116 2007-10-01 4 switching characteristics (unless otherwise specified, ta=-40 to 100 c,v cc =4.5~5.5v) characteristic symbol te s t circuit conditions min. typ. max. unit propagation delay time to logic high output tphl i f =0 12ma ? ? 60 ns propagation delay time to logic low output tplh 5 i f =12 0ma r in =100 c l =15pf (note 5) ? ? 60 ns propagation delay time to logic high output tphl v in =0 5v (i f =0 8ma) ? ? 60 ns propagation delay time to logic low output tplh 6 v in =5 0v (i f =8 0ma) r in =470 c in= 27pf c l =15pf (note 5) ? ? 60 ns switching time dispersion between on and off |tphl- tplh| i f =12ma , r in =100 , cl=15pf (note 5) ? ? 30 ns output fall time(90-10%) i f =0 12ma ? 15 ? ns output rise time(10-90%) 5 i f =12 0ma r in =100 c l =15pf (note 5) ? 15 ? ns common mode transient immunity at high level output cm h v cm =1000vp-p,i f =0ma, vo(min)=4v,ta=25 c 10000 ? ? v/us common mode transient immunity at low level output cm l 7 v cm =1000vp-p,i f =12ma, vo(max)=0.4v,ta=25 c -10000 ? ? v/us *all typical values are at ta=25 c note 5 : c l is approximately 15pf which includes probe and jig/stray wiring capacitance. test circuit 1 : v ol test circuit 2 : v oh test circuit 3 : i ccl test circuit 4: i cch v cc if v cc gnd shield 0.1uf v ol 1 3 6 5 4 v i ol v cc v cc gnd shield 0.1uf v oh 1 3 6 5 4 v i oh 1 6 v cc gnd shield 3 5 4 i ccl a if v cc v cc gnd shield v cc 1 3 6 5 4 i cch a free datasheet http:///
TLP116 2007-10-01 5 test circuit 5 : tphl , tplh test circuit 6 : tphl , tplh test circuit 7 : common-mode trans ient immunity test circuit cm l cm h 10% 90% 1000 ?sw b : i f =0ma 0.4v 4v tr tf ?sw a : i f =5ma )( )(800 s t r v h cm = )( )(800 s t f v l cm = 0.1uf v o v cc sw if 3 6 5 4 v c b v cc gnd shield a cl is capacitance of the probe and jig. (p.g) : pulse generator i f =12ma(p.g) (f=5mhz , duty=50%) 0.1uf v cc r in =100 input monitoring node cl=15pf cl=15pf vo monitoring node vcc gnd shield v in =5v(p.g) (f=5mhz , duty=50%) 0.1uf v cc r in =470 c in =27pf cl=15pf cl is capacitance of the probe and jig. vo monitoring node cl=15pf input monitoring node (p.g) : pulse generator vcc gnd shield tphl tplh i f 1.5v v o 50% v ol v oh tf tr 10% 90% tphl tplh i f 1.5v v o 50% v ol v oh tf tr 10% 90% free datasheet http:///
TLP116 2007-10-01 6 i f -v f ? v f / ? ta - i f forward current i f (ma) 0.8 1 1.2 1.4 1.6 1.8 0.1 1 10 100 coefficient ? v f /? ta ( m v / c ) 0.1 1 10 100 -3 -2.5 -2 -1.5 -1 -0.5 0 forward voltage v f (v) forward current i f (ma) v ol -ta v oh -ta logic low output voltage v ol(v) -40-20 0 20406080100 0 0.2 0.4 0.6 0.8 1 logic high output voltage voh(v) -40-20 0 20406080100 0 1 2 3 4 5 6 ambient temperature ta( ) ambient temperature ta( ) i ccl -ta i cch -ta logic low supply current i ccl (ma) -40-20 0 20406080100 0 2 4 6 8 10 logic high supply current i cch (ma) -40-20 0 20406080100 0 2 4 6 8 10 ambient temperature ta( ) ambient temperature ta( ) * : the above graphs show typical characteristics. 100c 25c -40c i ol =1.6ma , i f =12ma, v cc =5v i oh =-0.02ma , v f =1.05v v cc =5v i f =12ma v cc =5.5v v f =0v v cc =5.5v free datasheet http:///
TLP116 2007-10-01 7 t phl ,t plh -ta t phl ,t plh -ta propagation delay time t plh , t phl (ns) -40-20 0 20406080100 0 10 20 30 40 50 60 propagation delay time t plh , t phl (ns) -40-20 0 20406080100 0 10 20 30 40 50 60 ambient temperature ta( ) ambient temperature ta( ) t phl ,t plh -i f t phl ,t plh -v cc propagation delay time t plh , t phl (ns) 0 5 10 15 20 10 20 30 40 50 60 70 propagation delay time t plh , t phl (ns) 4.5 5 5.5 0 10 20 30 40 50 60 forward current i f (ma) supply voltage v cc (v) |tphl-tplh|-ta i flh -ta switching time dispersion between on and off(ns) -40-20 0 20406080100 0 5 10 15 20 25 30 threshold input current i flh (ma) -40 -20 0 20 40 60 80 100 0 1 2 3 4 5 ambient temperature ta( ) ambient temperature ta( ) * : the above graphs show typical characteristics. test circuit 5 i f =12ma,r in =100 , c l =15pf,v cc =5.5v test circuit 6 v in =5v,r in =470 c in= 27pf,c l =15pf,v cc =5.5v tplh tphl tplh tphl test circuit 5 r in =100 ? , c l =15pf v cc =5.5v tplh tphl test circuit 5 i f =12ma , r in =100 ? c l =15pf , ta=25c tphl tplh i o =1.6ma v o <0.4v test circuit 5 test circuit 6 free datasheet http:///
TLP116 2007-10-01 8 restrictions on product use 20070701-en ? the information contained herein is subject to change without notice. ? toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity an d vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba produc ts, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshib a products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconduct or devices,? or ?toshiba semiconductor reliability handbook? etc. ? the toshiba products listed in this document are in tended for usage in general electronics applications (computer, personal equipment, office equipment, measuri ng equipment, industrial robotics, domestic appliances, etc.).these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage incl ude atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, et c.. unintended usage of toshiba products listed in his document shall be made at the customer?s own risk. ? the products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringement s of patents or other rights of the third parties which may result from its use. no license is granted by implic ation or otherwise under any patents or other rights of toshiba or the third parties. ? gaas(gallium arsenide) is used in this product. the dus t or vapor is harmful to the human body. do not break, cut, crush or dissolve chemically. ? please contact your sales representative for product- by-product details in this document regarding rohs compatibility. please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. free datasheet http:///
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